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Contactor Test System

 

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H1000 / H1010

Contactor Test System

1. Configuration
1) PMU for Contact Resistance Measurement

2) Load Cell for Contact Weight Measurement

3) Motor for Contact Length Measurement

4) CCD Camera to shoot Video (only H1010)

5) Hot Plate for Temperature Stress
    (only H1010)

6) GUI
2. Test Item
1) Contact Force (mg)

2) Contact Length  (um)

3) Contact Resistance  (uΩ)

4) CCC(Current-Carrying Capability) (A)

5) Life-Cycle (Number of contact)

6) Shoot Video for Contacting (only H1010)

7) Temperature Stress (only H1010)
H1000

반도체 Testing에 사용되는 Socket의 신뢰성 및 Outgoing Test에 사용.

H1010

Micro Probe Pin의 신뢰성 특성 Test에 사용.

Home < Products < Contactor Test System

H1000

Socket Test System

1. 용도

: 반도체 Testing에 사용되는 Socket의 신뢰성 및 Outgoing Test에 사용.


2. 주요사양
Footprint (W*D*H)
1,000mm x 600mm x 1,540mm 
PMUVSIM / ISVM / VM / VSVM
Current : -1.0A ~ 1.0A
Voltage : -8V ~ 8V
Resistance measure : 0~8k Ω / ±1.3mΩ
Weight MeasureRange 0 ~ 30kg / Resolution 5g
Z-Axis MotorMove Resolution 1um
Move Speed 10mm/sec.

Home < Products < Contactor Test System 

H1010

Probe Pin Test System

1. 용도

: Micro Probe Pin의 신뢰성 특성을 Test.


2. 주요사양
Footprint (W*D*H)
600mm x 600mm x 1,500mm 
PMUVSIM / ISVM / VM / VSVM
Current : -2.0A ~ 2.0A
Voltage : -8V ~ 8V
Resistance measure : 0~8k Ω / ±1.3mΩ
Weight MeasureRange 0 ~ 100g / Resolution 0.1g
Z-Axis MotorMove Resolution 1um
Move Speed 10mm/sec.
Hot Plate0℃ ~ 300 ℃ / ± 0.1℃
CCC(Current-Carrying Capability) Function

Contactor Test System

1. Configuration
1) PMU for Contact Resistance Measurement

2) Load Cell for Contact Weight Measurement

3) Motor for Contact Length Measurement

4) CCD Camera to shoot Video (only H1010)

5) Hot Plate for Temperature Stress (only H1010)

6) GUI


2. Test Item
1) Contact Force (mg)

2) Contact Length  (um)

3) Contact Resistance  (uΩ)

4) CCC(Current-Carrying Capability)  (A)

5) Life-Cycle (Number of contact)

6) Shoot Video for Contacting (only H1010)

7) Temperature Stress (only H1010)

Socket Test System (H1000)

1. 용도
   :  반도체 Testing에 사용되는 Socket의 신뢰성 및 Outgoing Test에 사용


2. 주요사양
  1) Footprint (W*D*H)
1000mm x 600mm x 1540mm
  2) PMU



VSIM / ISVM / VM / VSVM
Current  : -1.0A ~ 1.0A
Voltage  : -8V ~ 8V
Resistance Measure : 0~8k Ω / ±1.3mΩ
  3) Weight Measure
Range 0 ~ 30kg / Resolution 5g
  4) Z-Axis Motor
Move Resolution 1um
Move Speed 10mm/sec.


Probe Pin Test System (H1010)

1. 용도

     :   Micro Probe Pin의 신뢰성 특성을 Test.


2. 주요사양

  1) Footprint (W*D*H)
600mm x 600mm x 1500mm
  2) PMU



VSIM / ISVM / VM / VSVM
Current  : -2.0A ~ 2.0A
Voltage  : -8V ~ 8V
Resistance Measure : 0~8k Ω / ±1.3mΩ
  3) Weight Measure
Range 0 ~ 100g / Resolution 0.1g
  4) X/Z-Axis Motor
Move Resolution 1um
Move Speed 10mm/sec.
  5) Hot Plate
0℃ ~ 300 ℃ / ± 0.1℃
  6) CCC(Current-Carrying Capability) Function